Standard IEC standard · IEC 60749-10:2002

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

Status: Withdrawn

· Replaced by: IEC 60749-10:2022 Corrected by: IEC 60749-10:2002/COR1:2003
Buy this standard

Standard IEC standard · IEC 60749-10:2002

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
Subscribe on standards - Read more Dölj
Price: 360 SEK
standard ikon pdf

PDF

Price: 360 SEK
standard ikon

Paper

Show more Show less
Scope
Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages.

The contents of the corrigendum of August 2003 have been included in this copy.

Subjects

General (31.080.01)


Buy this standard

Standard IEC standard · IEC 60749-10:2002

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
Subscribe on standards - Read more Dölj
Price: 360 SEK
standard ikon pdf

PDF

Price: 360 SEK
standard ikon

Paper

Show more Show less

Product information

Language: English French

Written by: IEC

International title:

Article no: STD-559178

Edition: 1

Approved: 4/9/2002

No of pages: 7

Replaces: IEC PAS 62186:2000 , IEC 60749:1996/AMD2:2001 , IEC 60749:1996/AMD1:2000 , IEC 60749:1996

Replaced by: IEC 60749-10:2022