Standard IEC standard · IEC 60749-12:2002

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Status: Withdrawn

· Replaced by: IEC 60749-12:2017 Corrected by: IEC 60749-12:2002/COR1:2003

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Standard IEC standard · IEC 60749-12:2002

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Scope

Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.

The contents of the corrigendum of August 2003 have been included in this copy.

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General (31.080.01)

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Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

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