Standard IEC standard · IEC 60749-4:2002

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Status: Withdrawn

· Replaced by: IEC 60749-4:2017 Corrected by: IEC 60749-4:2002/COR1:2003

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Standard IEC standard · IEC 60749-4:2002

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Scope

Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

The contents of the corrigendum of August 2003 have been included in this copy.

Subjects

General (31.080.01)

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Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

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