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Standard IEC standard · IEC 60749-5:2003

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Status: Withdrawn

· Replaced by: IEC 60749-5:2017
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Standard IEC standard · IEC 60749-5:2003

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
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Scope
Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

Subjects

General (31.080.01)

Buy this standard

Standard IEC standard · IEC 60749-5:2003

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Subscribe on standards with our subscription service. When you use our service you can be assured the latest editions and easy access. Read more about SIS Subscriptions
Subscribe on standards - Read more Dölj
Price: 360 SEK
standard ikon pdf

PDF

Price: 360 SEK
standard ikon

Paper

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Product information

Language: English French

Written by: IEC

International title:

Article no: STD-562745

Edition: 1

Approved: 1/17/2003

No of pages: 13

Replaces: IEC PAS 62161:2000 , IEC 60749:1996/AMD2:2001 , IEC 60749:1996/AMD1:2000 , IEC 60749:1996

Replaced by: IEC 60749-5:2017