Standard IEC standard · IEC 60749-6:2002

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

Status: Withdrawn

· Replaced by: IEC 60749-6:2017 Corrected by: IEC 60749-6:2002/COR1:2003

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Standard IEC standard · IEC 60749-6:2002

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Scope

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.

The contents of the corrigendum of August 2003 have been included in this copy.

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General (31.080.01)

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Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

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