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Standard IEC standard · IEC 60749-6:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

Status: Withdrawn

· Replaced by: IEC 60749-6:2017
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Standard IEC standard · IEC 60749-6:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
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Scope
Modification of the validity date: now put at 2007.

Subjects

General (31.080.01)

Buy this standard

Standard IEC standard · IEC 60749-6:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Subscribe on standards with our subscription service. When you use our service you can be assured the latest editions and easy access. Read more about SIS Subscriptions
Subscribe on standards - Read more Dölj
Price: 0 SEK
standard ikon pdf

PDF

Price: 0 SEK
standard ikon

Paper

Show more Show less

Product information

Language: English French

Written by: IEC

International title:

Article no: STD-565954

Edition: 1

Approved: 8/12/2003

No of pages: 0

Correction: IEC 60749-6:2002

Replaced by: IEC 60749-6:2017