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Standard IEC standard · IEC 60749-7:2002

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

Status: Withdrawn

· Replaced by: IEC 60749-7:2011 Corrected by: IEC 60749-7:2002/COR1:2003 Cor 1
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Standard IEC standard · IEC 60749-7:2002

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
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Scope
Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applicati

Subjects

General (31.080.01)

Buy this standard

Standard IEC standard · IEC 60749-7:2002

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Subscribe on standards with our subscription service. When you use our service you can be assured the latest editions and easy access. Read more about SIS Subscriptions
Subscribe on standards - Read more Dölj
Price: 360 SEK
standard ikon pdf

PDF

Price: 360 SEK
standard ikon

Paper

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Product information

Language: English French

Written by: IEC

International title:

Article no: STD-559176

Edition: 1

Approved: 4/9/2002

No of pages: 15

Replaces: IEC 60749:1996/AMD2:2001 , IEC 60749:1996/AMD1:2000 , IEC 60749:1996

Replaced by: IEC 60749-7:2011