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Standard Swedish standard · SS-EN 60749-43

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

Status: Valid to 9/29/2024

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Standard Swedish standard · SS-EN 60749-43

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
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Subjects

General (31.080.01)

Buy this standard

Standard Swedish standard · SS-EN 60749-43

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
Subscribe on standards with our subscription service. When you use our service you can be assured the latest editions and easy access. Read more about SIS Subscriptions
Subscribe on standards - Read more Dölj
Price: 852 SEK
standard ikon pdf

PDF

Price: 852 SEK
standard ikon

Paper

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Product information

Language: English

Written by: SEK SVENSK ELSTANDARD

International title:

Article no: STD-80001827

Edition: 1

Approved: 3/14/2018

Valid to: 9/29/2024

No of pages: 40

Parallell edition: SS-EN IEC 63287-1, utg 1:2022