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Standard Swedish standard · SS-EN IEC 60749-37, utg 2:2023

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

Status: Valid

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Standard Swedish standard · SS-EN IEC 60749-37, utg 2:2023

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
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Subjects

General (31.080.01)

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Standard Swedish standard · SS-EN IEC 60749-37, utg 2:2023

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Subscribe on standards with our subscription service. When you use our service you can be assured the latest editions and easy access. Read more about SIS Subscriptions
Subscribe on standards - Read more Dölj
Price: 382 SEK
standard ikon pdf

PDF

Price: 382 SEK
standard ikon

Paper

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Product information

Language: English

Written by: SEK SVENSK ELSTANDARD

International title:

Article no: STD-80041349

Edition: 2

Approved: 2/22/2023

No of pages: 23

Parallell edition: SS-EN 60749-37