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Standard Swedish standard · SS-EN 60749-37

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

Status: Valid to 11/16/2025

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Standard Swedish standard · SS-EN 60749-37

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
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Subjects

General (31.080.01)

Buy this standard

Standard Swedish standard · SS-EN 60749-37

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Subscribe on standards with our subscription service. When you use our service you can be assured the latest editions and easy access. Read more about SIS Subscriptions
Subscribe on standards - Read more Dölj
Price: 382 SEK
standard ikon pdf

PDF

Price: 382 SEK
standard ikon

Paper

Show more Show less

Product information

Language: English

Written by: SEK SVENSK ELSTANDARD

International title:

Article no: STD-3333633

Edition: 1

Approved: 1/26/2009

Valid to: 11/16/2025

No of pages: 20

Parallell edition: SS-EN IEC 60749-37, utg 2:2023