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Standard Swedish standard · SS-EN 62374

Semiconductor devices - Time Dependent Dielectric Breakdown test (TDDB) test for gate dielectric films

Status: Valid

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Standard Swedish standard · SS-EN 62374

Semiconductor devices - Time Dependent Dielectric Breakdown test (TDDB) test for gate dielectric films
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Subjects

Semiconductor devices (31.080)

Buy this standard

Standard Swedish standard · SS-EN 62374

Semiconductor devices - Time Dependent Dielectric Breakdown test (TDDB) test for gate dielectric films
Subscribe on standards with our subscription service. When you use our service you can be assured the latest editions and easy access. Read more about SIS Subscriptions
Subscribe on standards - Read more Dölj
Price: 382 SEK
standard ikon pdf

PDF

Price: 382 SEK
standard ikon

Paper

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Product information

Language: English

Written by: SEK SVENSK ELSTANDARD

International title:

Article no: STD-3333300

Edition: 1

Approved: 5/19/2008

No of pages: 22