Standard IEC standard · IEC 61000-4-20:2003

Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

Status: Withdrawn

· Replaced by: IEC 61000-4-20:2010 Amended by: IEC 61000-4-20:2003/AMD1:2006
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Standard IEC standard · IEC 61000-4-20:2003

Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
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Scope
Relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. This includes open (for example, striplines and EMP simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. The frequency ran

Subjects

Emission (33.100.10) Immunity (33.100.20)


Buy this standard

Standard IEC standard · IEC 61000-4-20:2003

Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
Subscribe on standards - Read more Dölj
Price: 4 995 SEK
standard ikon pdf

PDF

Price: 4 995 SEK
standard ikon

Paper

Show more Show less

Product information

Language: English French

Written by: IEC

International title:

Article no: STD-562736

Edition: 1

Approved: 1/29/2003

No of pages: 129

Replaced by: IEC 61000-4-20:2010