Standard IEC standard · IEC 60749-10:2002

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

Status: Upphävd

· Ersätts av: IEC 60749-10:2022 Korrigeras av: IEC 60749-10:2002/COR1:2003
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Standard IEC standard · IEC 60749-10:2002

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
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Omfattning
Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages.

The contents of the corrigendum of August 2003 have been included in this copy.

Ämnesområden

Allmänt Halvledarkomponenter (31.080.01)


Köp denna standard

Standard IEC standard · IEC 60749-10:2002

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
Prenumerera på standarden - Läs mer Dölj
Pris: 360 SEK
standard ikon pdf

PDF

Pris: 360 SEK
standard ikon

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Produktinformation

Språk: Engelska Franska

Framtagen av: IEC

Internationell titel: Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

Artikelnummer: STD-559178

Utgåva: 1

Fastställd: 2002-04-09

Antal sidor: 7

Ersätter: IEC PAS 62186:2000 , IEC 60749:1996/AMD2:2001 , IEC 60749:1996/AMD1:2000 , IEC 60749:1996

Ersätts av: IEC 60749-10:2022