Standard IEC standard · IEC 60749:1996

Semiconductor devices - Mechanical and climatic test methods

Status: Upphävd

· Ersätts av: IEC 60749-20:2002 , IEC 60749-10:2002 , IEC 60749-25:2003 , IEC 60749-19:2003 , IEC 60749-36:2003 , IEC 60749-22:2002 , IEC 60749-5:2003 , IEC 60749-2:2002 , IEC 60749-12:2002 , IEC 60749-21:2004 , IEC 60749-13:2002 , IEC 60749-14:2003 , IEC 60749-31:2002 , IEC 60749-32:2002 , IEC 60749-8:2002 , IEC 60749-1:2002 , IEC 60749-15:2003 , IEC 60749-7:2002 , IEC 60749-11:2002 , IEC 60749-3:2002 , IEC 60749-4:2002 , IEC 60749-6:2002 , IEC 60749-9:2002 , IEC 60749-24:2004 Tillägg: IEC 60749:1996/AMD2:2001 , IEC 60749:1996/AMD1:2000
Köp denna standard

Standard IEC standard · IEC 60749:1996

Semiconductor devices - Mechanical and climatic test methods
Prenumerera på standarden - Läs mer Dölj
Pris: 7 085 SEK
standard ikon pdf

PDF

Pris: 7 085 SEK
standard ikon

Papper

Fler alternativ Färre alternativ
Omfattning
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properti

Ämnesområden

Allmänt Halvledarkomponenter (31.080.01)


Köp denna standard

Standard IEC standard · IEC 60749:1996

Semiconductor devices - Mechanical and climatic test methods
Prenumerera på standarden - Läs mer Dölj
Pris: 7 085 SEK
standard ikon pdf

PDF

Pris: 7 085 SEK
standard ikon

Papper

Fler alternativ Färre alternativ

Produktinformation