Standard IEC standard · IEC 60749-34:2004

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling

Status: Upphävd

· Ersätts av: IEC 60749-34:2010
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Standard IEC standard · IEC 60749-34:2004

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
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Omfattning
Used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors. This happens when low-voltage operating biases for forward conduction (load currents) are periodically applied and removed causing rapid changes of temper

Ämnesområden

Halvledarkomponenter (31.080) Allmänt Halvledarkomponenter (31.080.01)


Köp denna standard

Standard IEC standard · IEC 60749-34:2004

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Prenumerera på standarden - Läs mer Dölj
Pris: 360 SEK
standard ikon pdf

PDF

Pris: 360 SEK
standard ikon

Papper

Fler alternativ Färre alternativ

Produktinformation

Språk: Engelska

Framtagen av: IEC

Internationell titel: Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling

Artikelnummer: STD-566564

Utgåva: 1

Fastställd: 2004-03-10

Antal sidor: 8

Ersätter: IEC PAS 62206:2000

Ersätts av: IEC 60749-34:2010